Probe Card: A Critical Enabler in Semiconductor Testing
A probe card is a vital component in the semiconductor manufacturing process, serving as the interface between the test system and the wafer. It enables electrical testing of integrated circuits (ICs) before they are packaged, ensuring that only functional chips move forward in the production process. As chip complexity grows, the role of the probe card has become increasingly sophisticated, impacting both testing accuracy and manufacturing efficiency.
What Is a Probe Card?
A probe card is a device that establishes a temporary electrical connection between the test equipment and the semiconductor wafer. It consists of an array of tiny probe needles or MEMS (Micro-Electro-Mechanical Systems) structures that make contact with the wafer’s pads. This allows electrical signals to pass through, enabling testing of the device’s performance and functionality under real operating conditions.